Low-Sensitivity to Process Variations Aging Sensor for Automotive Safety-Critical Applications

AuthID
 P-007-TMD
7
Author(s)
Vazquez, JC
·
Champac, V
·
Ziesemer, AM
·
Reis, R
·
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in Proceedings of the IEEE VLSI Test Symposium
Páginas: 238-243
Conference
28Th Ieee Vlsi Test Symposium, Vts10, Date: 19 April 2010 through 22 April 2010, Location: Santa Cruz, CA, Patrocinadores: IEEE Computer Society Test Technology Technical Council
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Publication Identifiers
SCOPUS: 2-s2.0-77953883911
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