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Investigating the Use of Bics to Detect Resistive- Open Defects in Srams

AuthID
P-007-VXG

Author(s)

Chipana, R

Bolzani, L

Vargas, F

Semiao, J

Rodriguez Andina, J

Teixeira, I

Teixeira, P

Tipo de Documento

Proceedings Paper

Year published

2010

Publicado

in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010

Páginas: 200-201

Conference

16Th Ieee International On-Line Testing Symposium, Iolts 2010, Date: 5 July 2010 through 7 July 2010, Location: Corfu Island, Patrocinadores: IEEE;TTTC

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Publication Identifiers

DOI: 10.1109/iolts.2010.5560207

SCOPUS: 2-s2.0-77957992089

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Investigating the Use of Bics to Detect Resistive- Open Defects in Srams

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