in 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS in IEEE VLSI Test Symposium, ISSN: 1093-0167
Páginas: 326-332 (3)
Conference
17Th Ieee Very Large Scale Intergration Test Symposium, Date: APR 25-29, 1999, Location: DANA POINT, CA, Patrocinadores: IEEE, Comp Soc, Tech Comm Test Technol
