Publicações

Fault-Tolerance in Fpga Focusing Power Reduction or Performance Enhancement

AuthID
P-00G-CVT

Author(s)

Leong, C

Tipo de Documento

Proceedings Paper

Year published

2015

Publicado

in 2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)

Conference

16Th Ieee Latin American Test Symposium (Lats), Date: MAR 25-27, 2015, Location: Puerto Vallarta, MEXICO, Patrocinadores: IEEE, Natl Inst Astrophys Opt Electron, Test Technol Techn Council, IEEE Council Electron Design Automat

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Publication Identifiers

DOI: 10.1109/latw.2015.7102523

SCOPUS: 2-s2.0-84933575114

Wos: WOS:000380400700043

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