On High-Quality, Low Energy Built-In Self Test Preparation at Rt-Level

AuthID
 P-000-96Y
6
Author(s)
Manich, S
·
Balado, L
·
Figueras, J
Tipo de Documento
Article
Year published
2004
Publicado
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 20, Número: 4, Páginas: 345-355 (11)
Conference
3Rd Ieee Latin-American Test Workshop, Date: 2002, Location: Montevideo, URUGUAY, Patrocinadores: IEEE
Indexing
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-4444319505
Wos: WOS:000223553500004
Source Identifiers
ISSN: 0923-8174
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