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TÃTULO: Surface composition and morphology changes of JET tiles under plasma interactions Full Text
AUTORES: Alves, LC ; Alves, E ; Barradas, NP ; Dias, M; Mateus, R ; Carvalho, P ; Coad, JP; Widdowson, AM; Likonen, J; Koivuranta, S;
PUBLICAÇÃO: 2011, FONTE: 26th Symposium on Fusion Technology (SOFT) in FUSION ENGINEERING AND DESIGN, VOLUME: 86, NÚMERO: 9-11

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TÃTULO: Tuning of the surface plasmon resonance in TiO(2)/Au thin films grown by magnetron sputtering: The effect of thermal annealing Full Text
AUTORES: Torrell, M; Kabir, R; Cunha, L ; Vasilevskiy, MI ; Vaz, F ; Cavaleiro, A ; Alves, E ; Barradas, NP ;
PUBLICAÇÃO: 2011, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 109, NÚMERO: 7

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TÃTULO: A new ion beam analysis data format Full Text
AUTORES: Barradas, NP ; Mayer, M; Thompson, M;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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TÃTULO: Al1-xInxN/GaN bilayers: Structure, morphology, and optical properties Full Text
AUTORES: Lorenz, K ; Magalhaes, S; Franco, N; Barradas, NP ; Darakchieva, V; Alves, E ; Pereira, S ; Correia, MR ; Munnik, F; Martin, RW; O'Donnell, KP; Watson, IM;
PUBLICAÇÃO: 2010, FONTE: E-MRS Fall Meeting on Wide Band Gap II-VI and III-V Semiconductors in PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, VOLUME: 247, NÚMERO: 7

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TÃTULO: Artificial neural networks for instantaneous analysis of real-time Rutherford backscattering spectra Full Text
AUTORES: Demeulemeester, J; Smeets, D; Barradas, NP ; Vieira, A; Comrie, CM; Temst, K; Vantomme, A;
PUBLICAÇÃO: 2010, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 10

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TÃTULO: Carbon film growth and hydrogenic retention of tungsten exposed to carbon-seeded high density deuterium plasmas Full Text
AUTORES: Wright, GM; Al, RS; Alves, E ; Alves, LC ; Barradas, NP ; Kleyn, AW; Lopes J L Cardozo; van der Meiden, HJ; Philipps, V; van Rooij, GJ; Shumack, AE; Vijvers, WAJ; Westerhout, J; Zoethout, E; Rapp, J;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF NUCLEAR MATERIALS, VOLUME: 396, NÚMERO: 2-3

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TÃTULO: CdTe detector use for PIXE characterization of TbCoFe thin films Full Text
AUTORES: Chaves, PC ; Taborda, A ; Barradas, NP ; Miguel A. Reis ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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TÃTULO: Effect of annealing on AlN/GaN quantum dot heterostructures: Advanced ion beam characterization and X-ray study of low-dimensional structures Full Text
AUTORES: Magalhaes, S; Lorenz, K ; Franco, N; Barradas, NP ; Alves, E ; Monteiro, T ; Amstatt, B; Fellmann, V; Daudin, B;
PUBLICAÇÃO: 2010, FONTE: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices in SURFACE AND INTERFACE ANALYSIS, VOLUME: 42, NÚMERO: 10-11

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TÃTULO: Electrical and Raman Scattering Studies of ZnO:P and ZnO:Sb Thin Films
AUTORES: de Campos, JA; Viseu, T ; Rolo, AG ; Barradas, NP ; Alves, E ; de Lacerda Aroso, T ; Cerqueira, MF ;
PUBLICAÇÃO: 2010, FONTE: 2nd International Conference on Advanced Nano Materials in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, VOLUME: 10, NÚMERO: 4

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