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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
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Document Source:
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Document Type:
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Article (512)
Proceedings Paper (76)
Correction (4)
Review (2)
Editorial Material (2)
Erratum (1)
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Order:
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Results:
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Confirmed Publications: 597
381
TITLE:
Stability of erbium and silver implanted in silica-titania sol-gel films
Full Text
AUTHORS:
Ramos, AR
;
Marques, C
;
Alves, E
;
Marques, AC
;
Almeida, RM
;
PUBLISHED:
2005
,
SOURCE:
8th European Conference on Accelerators in Applied Research and Technology
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
240,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
382
TITLE:
Structural and composition analysis of GaN films deposited by cyclic-PLD at different substrate temperatures
Full Text
AUTHORS:
Sanguino, P
;
Teodoro, OMND
;
Niehus, M
;
Marques, CP
;
Moutinho, AMC
;
Alves, E
;
Schwarz, R
;
PUBLISHED:
2005
,
SOURCE:
SENSORS AND ACTUATORS A-PHYSICAL,
VOLUME:
121,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
:
4
IN MY:
ORCID
|
ResearcherID
383
TITLE:
Structural and optical characterization of decorative ZrOxN y thin films
AUTHORS:
Carvalho, P
;
Vaz, F
;
Cunha, L
;
Rebouta, L
;
Tavares, CJ
;
Moura, C
;
Alves, E
;
Cavaleiro, A
; Ph Godeau; Le Bourhis, E; Riviere, JP;
PUBLISHED:
2005
,
SOURCE:
SVC, Society of Vacuum Coaters - 48th Annual Technical Conference
in
Proceedings, Annual Technical Conference - Society of Vacuum Coaters
INDEXED IN:
Scopus
IN MY:
ORCID
384
TITLE:
Structural stability of decorative ZrNxOy thin films
Full Text
AUTHORS:
Carvalho, P
;
Vaz, F
;
Rebouta, L
;
Carvalho, S
;
Cunha, L
;
Goudeau, P
; Riviere, JP;
Alves, E
;
Cavaleiro, A
;
PUBLISHED:
2005
,
SOURCE:
9th International Conference on Plasma Surface Engineering
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
200,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
:
20
IN MY:
ORCID
|
ResearcherID
385
TITLE:
Structural, electrical, optical, and mechanical characterizations of decorative ZrOxNy thin films
Full Text
AUTHORS:
Carvalho, P;
Vaz, F
;
Rebouta, L
;
Cunha, L
;
Tavares, CJ
;
Moura, C
;
Alves, E
;
Cavaleiro, A
; Goudeau, P; Le Bourhis, E; Riviere, JP; Pierson, JF; Banakh, O;
PUBLISHED:
2005
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
98,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
386
TITLE:
The atomic structure of defects formed during doping of GaN with rare earth ions
Full Text
AUTHORS:
Wojtowicz, T
;
Ruterana, P
;
Lorenz, K
;
Wahl, U
;
Alves, E
;
Ruffenach, S
; Halambalakis, G; Briot, O;
PUBLISHED:
2005
,
SOURCE:
Symposium on Science and Technology of Nitrides and Related Materials/Wide Band Gap II-VI Semiconductors held at the E-MRS 2004 Fall Meeting
in
E-MRS 2004 Fall Meeting Symposia C and F,
VOLUME:
2,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
387
TITLE:
Up conversion from visible to ultraviolet in bulk ZnO implanted with Tm ions
Full Text
AUTHORS:
Monteiro, T
;
Neves, AJ
;
Soares, MJ
;
Carmo, MC
;
Peres, M
;
Alves, E
;
Rita, E
;
PUBLISHED:
2005
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
87,
ISSUE:
19
INDEXED IN:
Scopus
WOS
CrossRef
:
20
IN MY:
ORCID
|
ResearcherID
388
TITLE:
XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates
Full Text
AUTHORS:
Franco, N
;
Barradas, NP
;
Alves, E
;
Vallera, AM
; Morris, RJH; Mironov, OA; Parker, EHC;
PUBLISHED:
2005
,
SOURCE:
Symposium on Materials Science and Device Issues for Future Si-Based Technologies held at the 2005 EMRS Meeting
in
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,
VOLUME:
124,
ISSUE:
SUPPL.
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
389
TITLE:
Amorphisation of GaN during processing with rare earth ion beams
Full Text
AUTHORS:
Lorenz, K
;
Wahl, U
;
Alves, E
;
Wojtowicz, T
;
Ruterana, P
;
Ruffenach, S
; Briot, O;
PUBLISHED:
2004
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
36,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
390
TITLE:
Atomic environment and interfacial structural order of TiAlN/Mo multilayers
Full Text
AUTHORS:
Tavares, CJ
;
Rebouta, L
; Riviere, JP; Girardeau, T;
Goudeau, P
;
Alves, E
;
Barradas, NP
;
PUBLISHED:
2004
,
SOURCE:
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
187,
ISSUE:
2-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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