Marcelino Bicho dos Santos
AuthID: R-000-A9P
41
TÃTULO: Noise Minimization for Low Power Bandgap Reference and Low Dropout Regulator Cores
AUTORES: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLICAÇÃO: 2009, FONTE: Journal of Low Power Electronics, VOLUME: 5, NÚMERO: 2
AUTORES: Ângelo Monteiro; Marcelino Santos; Alexandre Neves; Nuno Dias;
PUBLICAÇÃO: 2009, FONTE: Journal of Low Power Electronics, VOLUME: 5, NÚMERO: 2
42
TÃTULO: The CMS experiment at the CERN LHC
AUTORES: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...Mais
PUBLICAÇÃO: 2008, FONTE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, NÚMERO: 8
AUTORES: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...Mais
PUBLICAÇÃO: 2008, FONTE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, NÚMERO: 8
INDEXADO EM: Scopus WOS
NO MEU: ORCID | ResearcherID
43
TÃTULO: The CMS experiment at the CERN LHC
AUTORES: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...Mais
PUBLICAÇÃO: 2008, FONTE: J. Inst. - Journal of Instrumentation, VOLUME: 3, NÚMERO: 08
AUTORES: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...Mais
PUBLICAÇÃO: 2008, FONTE: J. Inst. - Journal of Instrumentation, VOLUME: 3, NÚMERO: 08
44
TÃTULO: Probabilistic testability analysis and DFT methods at RTL
AUTORES: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLICAÇÃO: 2006, FONTE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
AUTORES: Jose M Fernandes; Marcelino B Santos; Arlindo L Oliveira ; Joao C Teixeira;
PUBLICAÇÃO: 2006, FONTE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
NO MEU: ResearcherID
45
TÃTULO: Functional-oriented BIST of sequential circuits aiming at dynamic faults coverage
AUTORES: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLICAÇÃO: 2006, FONTE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
AUTORES: Guerreiro, F; Jorge Semião ; Pierce, A; Santos, MB; Teixeira, IM ; Teixeira, JP ;
PUBLICAÇÃO: 2006, FONTE: 9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, VOLUME: 2006
INDEXADO EM: Scopus WOS
NO MEU: ResearcherID
46
TÃTULO: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTORES: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
AUTORES: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXADO EM: WOS
NO MEU: ORCID | ResearcherID
47
TÃTULO: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTORES: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, NÚMERO: 4
AUTORES: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, NÚMERO: 4
48
TÃTULO: Modeling and simulation of time domain faults in digital systems
AUTORES: Barros, D; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2004, FONTE: 10th IEEE International On-Line Testing Symposium in 10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTORES: Barros, D; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2004, FONTE: 10th IEEE International On-Line Testing Symposium in 10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
INDEXADO EM: WOS
NO MEU: ResearcherID
49
TÃTULO: RTL test pattern generation for high quality loosely deterministic BIST Full Text
AUTORES: Santos, MB; Fernandes, JM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2003, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 03) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS
AUTORES: Santos, MB; Fernandes, JM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2003, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 03) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS
NO MEU: ResearcherID
50
TÃTULO: Fault simulation using partially reconfigurable hardware
AUTORES: Parreira, A; Teixeira, JP ; Pantelimon, A; Santos, MB; de Sousa, JT;
PUBLICAÇÃO: 2003, FONTE: 13th International Conference on Field-Programmable Logic and Applications (FPL 2003) in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, VOLUME: 2778
AUTORES: Parreira, A; Teixeira, JP ; Pantelimon, A; Santos, MB; de Sousa, JT;
PUBLICAÇÃO: 2003, FONTE: 13th International Conference on Field-Programmable Logic and Applications (FPL 2003) in FIELD-PROGRAMMABLE LOGIC AND APPLICATIONS, PROCEEDINGS, VOLUME: 2778
INDEXADO EM: Scopus WOS
NO MEU: ResearcherID