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TÍTULO: Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction  Full Text
AUTORES: Daniel Carvalho; Knut Mueller Caspary; Marco Schowalter; Tim Grieb; Thorsten Mehrtens; Andreas Rosenauer; Teresa Ben; Rafael Garcia; Andres Redondo Cubero; Katharina Lorenz; Bruno Daudin; Francisco M Morales;
PUBLICAÇÃO: 2016, FONTE: SCIENTIFIC REPORTS, VOLUME: 6
INDEXADO EM: Scopus WOS CrossRef