Sangaraju Venkata Jagadeesh Chandra
AuthID: R-000-T4H
1
TÃTULO: Investigations on Compositional, Structural and Optical Properties of Thermally Oxidized HfO2 Films
AUTORES: Venkataiah, S; Chandra, SVJ; Babu, MV; Uthanna, S;
PUBLICAÇÃO: 2021, FONTE: ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING
AUTORES: Venkataiah, S; Chandra, SVJ; Babu, MV; Uthanna, S;
PUBLICAÇÃO: 2021, FONTE: ARABIAN JOURNAL FOR SCIENCE AND ENGINEERING
INDEXADO EM: 
Scopus 
WOS
Scopus WOS2
TÃTULO: Post-deposition annealing influenced structural and electrical properties of Al/TiO2/Si gate capacitors Full Text
AUTORES: Chandra C Sekhar; Kondaiah, P; Mohan M Rao; Jagadeesh V J Chandra; Uthanna, S;
PUBLICAÇÃO: 2013, FONTE: SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 62
AUTORES: Chandra C Sekhar; Kondaiah, P; Mohan M Rao; Jagadeesh V J Chandra; Uthanna, S;
PUBLICAÇÃO: 2013, FONTE: SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 62
3
TÃTULO: Substrate temperature influenced physical properties of silicon MOS devices with TiO2 gate dielectric. Physical properties of Silicon MOS devices with TiO2 gate dielectric Full Text
AUTORES: Chandra C Sekhar; Kondaiah, P; Jagadeesh Chandra, SVJ; Mohan M Rao; Uthanna, S;
PUBLICAÇÃO: 2012, FONTE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 44, NÚMERO: 9
AUTORES: Chandra C Sekhar; Kondaiah, P; Jagadeesh Chandra, SVJ; Mohan M Rao; Uthanna, S;
PUBLICAÇÃO: 2012, FONTE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 44, NÚMERO: 9
4
TÃTULO: Modulations in effective work function of platinum gate electrode in metal-oxide-semiconductor devices Full Text
AUTORES: Jagadeesh V J Chandra; Fortunato, E ; Martins, R ; Chel Jong Choi;
PUBLICAÇÃO: 2012, FONTE: THIN SOLID FILMS, VOLUME: 520, NÚMERO: 14
AUTORES: Jagadeesh V J Chandra; Fortunato, E ; Martins, R ; Chel Jong Choi;
PUBLICAÇÃO: 2012, FONTE: THIN SOLID FILMS, VOLUME: 520, NÚMERO: 14
5
TÃTULO: Influence of substrate bias voltage on the physical, electrical and dielectric properties of RF magnetron sputtered TiO 2 films Full Text
AUTORES: Kondaiah, P; Sekhar, MC; Chandra, SVJ; Martins, R ; Uthanna, S; Elangovan, E;
PUBLICAÇÃO: 2012, FONTE: European Materials Research Society (EMRS) Fall Meeting 2011 Symposium K: Solution-Derived Electronic-Oxide Films Nanostructures and Patterning, from Materials to Devices in IOP Conference Series: Materials Science and Engineering, VOLUME: 30, NÚMERO: 1
AUTORES: Kondaiah, P; Sekhar, MC; Chandra, SVJ; Martins, R ; Uthanna, S; Elangovan, E;
PUBLICAÇÃO: 2012, FONTE: European Materials Research Society (EMRS) Fall Meeting 2011 Symposium K: Solution-Derived Electronic-Oxide Films Nanostructures and Patterning, from Materials to Devices in IOP Conference Series: Materials Science and Engineering, VOLUME: 30, NÚMERO: 1
INDEXADO EM: Scopus 
CrossRef
Scopus CrossRef6
TÃTULO: The effect of Substrate temperature on physical and electrical properties of DC magnetron sputtered (Ta2O5)(0.85)(TiO2)(0.15) films Full Text
AUTORES: Chandra C Sekhar; Uthanna, S; Martins, R ; Jagadeesh Chandra, SVJ; Elangovan, E;
PUBLICAÇÃO: 2012, FONTE: Symposium I on Advances in Transparent Electronics, from Materials to Devices III/Fall Meeting of the European-Materials-Research-Society (E-MRS) in E-MRS 2011 FALL SYMPOSIUM I: ADVANCES IN TRANSPARENT ELECTRONICS, FROM MATERIALS TO DEVICES III, VOLUME: 34, NÚMERO: 1
AUTORES: Chandra C Sekhar; Uthanna, S; Martins, R ; Jagadeesh Chandra, SVJ; Elangovan, E;
PUBLICAÇÃO: 2012, FONTE: Symposium I on Advances in Transparent Electronics, from Materials to Devices III/Fall Meeting of the European-Materials-Research-Society (E-MRS) in E-MRS 2011 FALL SYMPOSIUM I: ADVANCES IN TRANSPARENT ELECTRONICS, FROM MATERIALS TO DEVICES III, VOLUME: 34, NÚMERO: 1
