Eduardo Jorge da Costa Alves
AuthID: R-000-4EK
171
TÃTULO: Ag:TiN-Coated Polyurethane for Dry Biopotential Electrodes: From Polymer Plasma Interface Activation to the First EEG Measurements. Ag:TiN-Coated Polyurethane for Dry Biopotential Electrodes … Full Text
AUTORES: Paulo Pedrosa; Patrique Fiedler; Claudia Lopes; Eduardo Alves; Nuno P Barradas; Jens Haueisen; Ana V Machado; Carlos Fonseca ; Filipe Vaz;
PUBLICAÇÃO: 2016, FONTE: PLASMA PROCESSES AND POLYMERS, VOLUME: 13, NÚMERO: 3
AUTORES: Paulo Pedrosa; Patrique Fiedler; Claudia Lopes; Eduardo Alves; Nuno P Barradas; Jens Haueisen; Ana V Machado; Carlos Fonseca ; Filipe Vaz;
PUBLICAÇÃO: 2016, FONTE: PLASMA PROCESSES AND POLYMERS, VOLUME: 13, NÚMERO: 3
172
TÃTULO: Magnetoelectric effect probe through ppm Fe doping in BaTiO3 Full Text
AUTORES: Figueiras, FG ; Amorim, CO; Amaral, J; Agostinho Moreira, JA ; Tavares, PB ; Alves, E; Amaral, VS;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF ALLOYS AND COMPOUNDS, VOLUME: 661
AUTORES: Figueiras, FG ; Amorim, CO; Amaral, J; Agostinho Moreira, JA ; Tavares, PB ; Alves, E; Amaral, VS;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF ALLOYS AND COMPOUNDS, VOLUME: 661
173
TÃTULO: Study of nuclear reactions producing Cl-36 by micro-AMS
AUTORES: Luis, H; Jesus, AP ; Fonseca, M. ; Cruz, J ; Galaviz, D; Franco, N; Alves, E;
PUBLICAÇÃO: 2016, FONTE: 6th Nuclear Physics in Astrophysics Conference (NPA) in NUCLEAR PHYSICS IN ASTROPHYSICS VI (NPA6), VOLUME: 665
AUTORES: Luis, H; Jesus, AP ; Fonseca, M. ; Cruz, J ; Galaviz, D; Franco, N; Alves, E;
PUBLICAÇÃO: 2016, FONTE: 6th Nuclear Physics in Astrophysics Conference (NPA) in NUCLEAR PHYSICS IN ASTROPHYSICS VI (NPA6), VOLUME: 665
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ORCID174
TÃTULO: Utilization of native oxygen in Eu(RE)-doped GaN for enabling device compatibility in optoelectronic applications Full Text
AUTORES: Mitchell, B; Timmerman, D; Poplawsky, J; Zhu, W; Lee, D; Wakamatsu, R; Takatsu, J; Matsuda, M; Guo, W; Lorenz, K; Alves, E; Koizumi, A; Dierolf, V; Fujiwara, Y;
PUBLICAÇÃO: 2016, FONTE: SCIENTIFIC REPORTS, VOLUME: 6
AUTORES: Mitchell, B; Timmerman, D; Poplawsky, J; Zhu, W; Lee, D; Wakamatsu, R; Takatsu, J; Matsuda, M; Guo, W; Lorenz, K; Alves, E; Koizumi, A; Dierolf, V; Fujiwara, Y;
PUBLICAÇÃO: 2016, FONTE: SCIENTIFIC REPORTS, VOLUME: 6
175
TÃTULO: Identifying the influence of the intrinsic defects in Gd-doped ZnO thin-films Full Text
AUTORES: Flemban, TH; Sequeira, MC; Zhang, Z; Venkatesh, S; Alves, E; Lorenz, K; Roqan, IS;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 119, NÚMERO: 6
AUTORES: Flemban, TH; Sequeira, MC; Zhang, Z; Venkatesh, S; Alves, E; Lorenz, K; Roqan, IS;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 119, NÚMERO: 6
176
TÃTULO: Effect of AlN content on the lattice site location of terbium ions in AlxGa1-xN compounds Full Text
AUTORES: Fialho, M; Rodrigues, J; Magalhaes, S; Correia, MR; Monteiro, T; Lorenz, K; Alves, E;
PUBLICAÇÃO: 2016, FONTE: SEMICONDUCTOR SCIENCE AND TECHNOLOGY, VOLUME: 31, NÚMERO: 3
AUTORES: Fialho, M; Rodrigues, J; Magalhaes, S; Correia, MR; Monteiro, T; Lorenz, K; Alves, E;
PUBLICAÇÃO: 2016, FONTE: SEMICONDUCTOR SCIENCE AND TECHNOLOGY, VOLUME: 31, NÚMERO: 3
177
TÃTULO: Deposition in the inner and outer corners of the JET divertor with carbon wall and metallic ITER-like wall
AUTORES: Beal, J; Widdowson, A; Heinola, K; Baron-Wiechec, A; Gibson, KJ; Coad, JP; Alves, E; Lipschultz, B; Kirschner, A; Esser, HG; Matthews, GF; Brezinsek, S; JET Contributors, ;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
AUTORES: Beal, J; Widdowson, A; Heinola, K; Baron-Wiechec, A; Gibson, KJ; Coad, JP; Alves, E; Lipschultz, B; Kirschner, A; Esser, HG; Matthews, GF; Brezinsek, S; JET Contributors, ;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
178
TÃTULO: Raman microscopy investigation of beryllium materials
AUTORES: Pardanaud, C; Rusu, MI; Giacometti, G; Martin, C; Addab, Y; Roubin, P; Lungu, CP; Porosnicu, C; Jepu, I; Dinca, P; Lungu, M; Pompilian, OG; Mateus, R; Alves, E; Rubel, M;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
AUTORES: Pardanaud, C; Rusu, MI; Giacometti, G; Martin, C; Addab, Y; Roubin, P; Lungu, CP; Porosnicu, C; Jepu, I; Dinca, P; Lungu, M; Pompilian, OG; Mateus, R; Alves, E; Rubel, M;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
179
TÃTULO: Long-term fuel retention in JET ITER-like wall
AUTORES: Heinola, K; Widdowson, A; Likonen, J; Alves, E; Baron Wiechec, A; Barradas, N; Brezinsek, S; Catarino, N; Coad, P; Koivuranta, S; Krat, S; Matthews, GF; Mayer, M; Petersson, P; Contributors, J;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
AUTORES: Heinola, K; Widdowson, A; Likonen, J; Alves, E; Baron Wiechec, A; Barradas, N; Brezinsek, S; Catarino, N; Coad, P; Koivuranta, S; Krat, S; Matthews, GF; Mayer, M; Petersson, P; Contributors, J;
PUBLICAÇÃO: 2016, FONTE: 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC) in PHYSICA SCRIPTA, VOLUME: T167, NÚMERO: T167
180
TÃTULO: Electrochemical characterization of nanostructured Ag:TiN thin films produced by glancing angle deposition on polyurethane substrates for bio-electrode applications Full Text
AUTORES: Paulo Pedrosa; Diogo Machado; Patrique Fiedler; Beatriz Vasconcelos; Eduardo Alves; Nuno P Barradas; Nicolas Martin; Jens Haueisen; Filipe Vaz; Carlos Fonseca ;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF ELECTROANALYTICAL CHEMISTRY, VOLUME: 768
AUTORES: Paulo Pedrosa; Diogo Machado; Patrique Fiedler; Beatriz Vasconcelos; Eduardo Alves; Nuno P Barradas; Nicolas Martin; Jens Haueisen; Filipe Vaz; Carlos Fonseca ;
PUBLICAÇÃO: 2016, FONTE: JOURNAL OF ELECTROANALYTICAL CHEMISTRY, VOLUME: 768
