11
TÍTULO: Performance sensor for reliable operation
AUTORES: Jorge Semião; Cabral, R; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2018, FONTE: 12th International Conference on Universal Access in Human-Computer Interaction, UAHCI 2018 Held as Part of HCI International 2018 in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), VOLUME: 10908 LNCS
INDEXADO EM: Scopus CrossRef: 3
NO MEU: ORCID
12
TÍTULO: A Platform for the Promotion of Energy Efficiency and Monitoring in Hotel Units
AUTORES: Sergey Nogin; Jânio Monteiro ; Sergio Gómez Melgar; José Peyroteo; António Mortal; Carlos Miguel A Santos; José Livramento; Pedro J S Cardoso ; Jorge Semião;
PUBLICAÇÃO: 2017, FONTE: Handbook of Research on Technological Developments for Cultural Heritage and eTourism Applications - Advances in Hospitality, Tourism, and the Services Industry
INDEXADO EM: CrossRef
NO MEU: ORCID
13
TÍTULO: An Initial Framework to Develop a Mobile Five Human Senses Augmented Reality System for Museums
AUTORES: João M F Rodrigues ; Pedro J S Cardoso ; Joana Lessa; João André Pereira; João D P Sardo; Marco de Freitas; Jorge Semião; Jânio Monteiro ; Célia M Q Ramos ; Roberto Lam; Eduardo Esteves; Mauro Figueiredo; Alexandra Rodrigues Gonçalves ; Miguel Gomes; Paulo Bica;
PUBLICAÇÃO: 2017, FONTE: Handbook of Research on Technological Developments for Cultural Heritage and eTourism Applications - Advances in Hospitality, Tourism, and the Services Industry
INDEXADO EM: CrossRef: 7
NO MEU: ORCID
14
TÍTULO: Performance sensor for tolerance and predictive detection of delay-faults
AUTORES: Jorge Semião; Saraiva, D; Leong, C; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2014, FONTE: 27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
INDEXADO EM: Scopus CrossRef
NO MEU: ORCID
15
TÍTULO: Quality of electronic design: from architectural level to test coverage
AUTORES: O.P Dias; M.B Santos; J.P Teixeira; Jorge Semião; I.M Teixeira;
PUBLICAÇÃO: 2002, FONTE: Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
INDEXADO EM: CrossRef: 3
NO MEU: ORCID
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