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TÍTULO: The CMS experiment at the CERN LHC
AUTORES: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; Kastner, K; Krammer, M; Magrans de d Abril; Markytan, M; Mikulec, I; Neuherz, B; Nöbauer, T; Oberegger, M; Padrta, M; Pernicka, M; Porth, P; Rohringer, H; Schmid, S; Schreiner, T; Stark, R; Steininger, H; Strauss, J; Taurok, A; Uhl, D; Waltenberger, W; Walzel, G; Widl, E; C-E Wulz; Petrov, V; Prosolovich, V; Chekhovsky, V; Dvornikov, O; Emeliantchik, I; Litomin, A; Makarenko, V; Marfin, I; Mossolov, V; Shumeiko, N; Solin, A; Stefanovitch, R; Suarez S Gonzalez; Tikhonov, A; Fedorov, A; Korzhik, M; Missevitch, O; Zuyeuski, R; Beaumont, W; Cardaci, M; De D Langhe; De A D Wolf; Delmeire, E; Ochesanu, S; Tasevsky, M; Van V Mechelen; D'Hondt, J; De D Weirdt; Devroede, O; Goorens, R; Hannaert, S; Heyninck, J; Maes, J; Mozer, MU; Tavernier, S; Van V Doninck; Van V Lancker; Van V Mulders; Villella, I; Wastiels, C; Yu, C; Bouhali, O; Charaf, O; Clerbaux, B; De D Harenne; De D Lentdecker; Dewulf, JP; Elgammal, S; Gindroz, R; Hammad, GH; Mahmoud, T; Neukermans, L; Pins, M; Pins, R; Rugovac, S; Stefanescu, J; Sundararajan, V; Vander V Velde; Vanlaer, P; Wickens, J; Tytgat, M; Assouak, S; Bonnet, JL; Bruno, G; Caudron, J; De D Callatay; De Favereau De D Jeneret; De D Visscher; Demin, P; Favart, D; Felix, C; Florins, B; Forton, E; Giammanco, A; Grégoire, G; Jonckman, M; Kcira, D; Keutgen, T; Lemaitre, V; Michotte, D; Militaru, O; Ovyn, S; Pierzchala, T; Piotrzkowski, K; Roberfroid, V; Rouby, X; Schul, N; Van der d Aa; Beliy, N; Daubie, E; Herquet, P; Alves, G; Pol, ME; Souza, MHG; Vaz, M; De Jesus J Damiao; Oguri, V; Santoro, A; Sznajder, A; De Moraes M Gregores; Iope, RL; Novaes, SF; Tomei, T; Anguelov, T; Antchev, G; Atanasov, I; Damgov, J; Darmenov, N; Dimitrov, L; Genchev, V; Iaydjiev, P; Marinov, A; Piperov, S; Stoykova, S; Sultanov, G; Trayanov, R; Vankov, I; Cheshkov, C; Dimitrov, A; Dyulendarova, M; Glushkov, I; Kozhuharov, V; Litov, L; Makariev, M; Marinova, E; Markov, S; Mateev, M; Nasteva, I; Pavlov, B; Petev, P; Petkov, P; Spassov, V; Toteva, Z; Velev, V; Verguilov, V; Bian, JG; Chen, GM; Chen, HS; Chen, M; Jiang, CH; Liu, B; Shen, XY; Sun, HS; Tao, J; Wang, J; Yang, M; Zhang, Z; Zhao, WR; Zhuang, HL; Ban, Y; Cai, J; Ge, YC; Liu, S; Liu, HT; Liu, L; Qian, SJ; Wang, Q; Xue, ZH; Yang, ZC; Ye, YL; Ying, J; Li, PJ; Liao, J; Xue, ZL; Yan, DS; Yuan, H; Carrillo A C Montoya; Sanabria, JC; Godinovic, N; Puljak, I; Soric, I; Antunovic, Z; Dzelalija, M; Marasovic, K; Brigljevic, V; Kadija, K; Morovic, S; Fereos, R; Nicolaou, C; Papadakis, A; Ptochos, F; Razis, PA; Tsiakkouri, D; Zinonos, Z; Hektor, A; Kadastik, M; Kannike, K; Lippmaa, E; Müntel, M; Raidal, M; Rebane, L; Aarnio, PA; Anttila, E; Banzuzi, K; Bulteau, P; Czellar, S; Eiden, N; Eklund, C; Engstrom, P; Heikkinen, A; Honkanen, A; Härkönen, J; Karimäki, V; Katajisto, HM; Kinnunen, R; Klem, J; Kortesmaa, J; Kotamäki, M; Kuronen, A; Lampén, T; Lassila-Perini, K; Lefébure, V; Lehti, S; Lindén, T; Luukka, PR; Michal, S; Moura M Brigido; Mäenpää, T; Nyman, T; Nystén, J; Pietarinen, E; Skog, K; Tammi, K; Tuominen, E; Tuominiemi, J; Ungaro, D; Vanhala, TP; Wendland, L; Williams, C; Iskanius, M; Korpela, A; Polese, G; Tuuva, T; Bassompierre, G; Bazan, A; David, PY; Ditta, J; Drobychev, G; Fouque, N; Guillaud, JP; Hermel, V; Karneyeu, A; Le L Flour; Lieunard, S; Maire, M; Mendiburu, P; Nedelec, P; Peigneux, JP; Schneegans, M; Sillou, D; Vialle, JP; Anfreville, M; Bard, JP; Besson, P; Bougamont, E; Boyer, M; Bredy, P; Chipaux, R; Dejardin, M; Denegri, D; Descamps, J; Fabbro, B; Faure, JL; Ganjour, S; Gentit, FX; Givernaud, A; Gras, P; Hamel de d Monchenault; Jarry, P; Jeanney, C; Kircher, F; Lemaire, MC; Lemoigne, Y; Levesy, B; Locci, E; Lottin, JP; Mandjavidze, I; Mur, M; Pansart, JP; Payn, A; Rander, J; Reymond, JM; Rolquin, J; Rondeaux, F; Rosowsky, A; Rousse, JYA; 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Heinz Hofer; Horisberger, U; Horvath, I; Hristov, A; Humbertclaude, C; Iliev, B; Kastli, W; Kruse, A; Kuipers, J; Langenegger, U; Lecomte, P; Lejeune, E; Leshev, G; Lesmond, C; List, B; Luckey, PD; Lustermann, W; Maillefaud, JD; Marchica, C; Maurisset, A; Meier, B; Milenovic, P; Milesi, M; Moortgat, F; Nanov, I; Nardulli, A; Nessi-Tedaldi, F; Panev, B; Pape, L; Pauss, F; Petrov, E; Petrov, G; Peynekov, MM; Pitzl, D; Punz, T; Riboni, P; ...Mais
PUBLICAÇÃO: 2008, FONTE: J. Inst. - Journal of Instrumentation, VOLUME: 3, NÚMERO: 08
INDEXADO EM: CrossRef
NO MEU: ORCID
22
TÍTULO: Editorial: Design of circuits and integrated systems  Full Text
AUTORES: Paulo Teixeira, J; Silva Matos, J; Tomas, J; Cacho Teixeira, I;
PUBLICAÇÃO: 2007, FONTE: IET Computers & Digital Techniques - IET Comput. Digit. Tech., VOLUME: 1, NÚMERO: 5
INDEXADO EM: CrossRef
NO MEU: ORCID
23
TÍTULO: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip  Full Text
AUTORES: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, NÚMERO: 4
INDEXADO EM: CrossRef
NO MEU: ORCID
24
TÍTULO: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2002, FONTE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
INDEXADO EM: Scopus WOS CrossRef
25
TÍTULO: Optimizing functional distribution in complex system design
AUTORES: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLICAÇÃO: 2001, FONTE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXADO EM: Scopus WOS
26
TÍTULO: RTL design validation, DFT and test pattern generation for high defects coverage
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
27
TÍTULO: Design and test of certifiable ASICs for safety-critical gas burners control
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
28
TÍTULO: Test resource partitioning: a design & test issue
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef
29
TÍTULO: Towards e-management as enabler for accelerated change
AUTORES: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXADO EM: Scopus
30
TÍTULO: RTL-based functional test generation for high defects coverage in digital SOCs
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2000, FONTE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
Página 3 de 4. Total de resultados: 35.