João Paulo Cacho Teixeira
AuthID: R-000-7A4
151
TÃTULO: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTORES: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, NÚMERO: 4
AUTORES: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLICAÇÃO: 2005, FONTE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, NÚMERO: 4
152
TÃTULO: Occupational exposure to styrene: modulation of cytogenetic damage and levels of urinary metabolites of styrene by polymorphisms in genes CYP2E1, EPHX1, GSTM1, GSTT1 and GSTP1 Full Text
AUTORES: Teixeira, JP; Gaspar, J ; Silva, S; Torres, J; Silva, SN ; Azevedo, MC; Neves, P; Laffon, B; Mendez, J; Goncalves, C; Mayan, O; Farmer, PB; Rueff, J ;
PUBLICAÇÃO: 2004, FONTE: TOXICOLOGY, VOLUME: 195, NÚMERO: 2-3
AUTORES: Teixeira, JP; Gaspar, J ; Silva, S; Torres, J; Silva, SN ; Azevedo, MC; Neves, P; Laffon, B; Mendez, J; Goncalves, C; Mayan, O; Farmer, PB; Rueff, J ;
PUBLICAÇÃO: 2004, FONTE: TOXICOLOGY, VOLUME: 195, NÚMERO: 2-3
153
TÃTULO: A probabilistic method for the computation of testability of RTL constructs
AUTORES: Fernandes, JM; Santos, MB ; Oliveira, AL ; Teixeira, JC;
PUBLICAÇÃO: 2004, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 04) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, VOLUME: 1
AUTORES: Fernandes, JM; Santos, MB ; Oliveira, AL ; Teixeira, JC;
PUBLICAÇÃO: 2004, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 04) in DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, VOLS 1 AND 2, PROCEEDINGS, VOLUME: 1
154
TÃTULO: Technical feasibility assessment of oleic sunflower methyl ester utilisation in Diesel bus engines Full Text
AUTORES: da Silva, FN ; Prata, AS; Teixeira, JR;
PUBLICAÇÃO: 2003, FONTE: ENERGY CONVERSION AND MANAGEMENT, VOLUME: 44, NÚMERO: 18
AUTORES: da Silva, FN ; Prata, AS; Teixeira, JR;
PUBLICAÇÃO: 2003, FONTE: ENERGY CONVERSION AND MANAGEMENT, VOLUME: 44, NÚMERO: 18
155
TÃTULO: Aromatic DNA adduct levels in coke oven workers: correlation with polymorphisms in genes GSTP1, GSTM1, GSTT1 and CYP1A1 Full Text
AUTORES: Teixeira, JP; Gaspar, J ; Martinho, G; Silva, S; Rodrigues, S; Mayan, O; Martin, E; Farmer, PB; Rueff, J ;
PUBLICAÇÃO: 2002, FONTE: MUTATION RESEARCH-GENETIC TOXICOLOGY AND ENVIRONMENTAL MUTAGENESIS, VOLUME: 517, NÚMERO: 1-2
AUTORES: Teixeira, JP; Gaspar, J ; Martinho, G; Silva, S; Rodrigues, S; Mayan, O; Martin, E; Farmer, PB; Rueff, J ;
PUBLICAÇÃO: 2002, FONTE: MUTATION RESEARCH-GENETIC TOXICOLOGY AND ENVIRONMENTAL MUTAGENESIS, VOLUME: 517, NÚMERO: 1-2
156
TÃTULO: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2002, FONTE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2002, FONTE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
157
TÃTULO: Optimizing functional distribution in complex system design
AUTORES: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLICAÇÃO: 2001, FONTE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
AUTORES: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLICAÇÃO: 2001, FONTE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXADO EM: 
Scopus 
WOS
Scopus WOS158
TÃTULO: RTL design validation, DFT and test pattern generation for high defects coverage
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTORES: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
WOS159
TÃTULO: Design and test of certifiable ASICs for safety-critical gas burners control
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTORES: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLICAÇÃO: 2001, FONTE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXADO EM: WOS
WOS160
TÃTULO: Test resource partitioning: a design & test issue
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTORES: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLICAÇÃO: 2001, FONTE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
